An exploration of the physical nature of electron microscopy with emphasis on the scanning electron microscope (SEM). Students investigate the influence of electron beam parameters on imaging and how to correct imaging problems to optimize analysis. Topics covered include sample selection, sputter coating, cryo-preparation, and elemental analysis by energy dispersive spectrometry (EDS). Students gain extensive, hands-on experience using the SEM. Lecture and laboratory. Additional lab time required outside of scheduled lab. Cross-listed as GEOL 318 and ZOOL 318 . Prerequisites: any two science courses that count toward a science major, or permission of instructor. Fall (Group II)